Diffractometers



7 March 15, 1960 U. W. ARNDT ET'AL DIFFRACTOMETERS 5 Sheets-Sheet 1 Filed Oct. 3. 1958 F/GZ.

. uLRicH WOLFGANG Amm, moms HAMILTON FAULICNER and DAVID PHILLIPS m- 54 w '7 Attorney March 15, 1960 u, w, ARNDT ETAL I 2,928,945 DIFFRACTOMETERS Filed Oct. 3, 1958 3 Sheets-Sheet 2 ULRICH WOLFGANG ARNDI, THOMAS S HAI HLTON FAULICNER and DAVID CHILTON PHILLIPS [nae Attorney u. w. ARNDT El'AL 2,928,945

March 15, 1960 DIFFRACTOMETERS 3 Sheets-Sheet 3 Filed Oct. 3. 1958 i P ul. 1 4f wilmm v QU/ 'lllllilww 2 I ULRICH WOLFGANG ARNDI, THOMAS HAMILTON FAULIQIER and DAVID) I CHILTON PHILLIPS Inventors (g /2d ""x'a pm B A ttnrne V United States Patent DIFFRACTOMETERS Ulrich Wolfgang Arndt, London, Thomas Hamilton Faulkner, North Cheam, ad David {Ihilton Phillips, London, England, assignors to National Research Development Corporation, a corporation of Great Britain and Northern Ireland Application October 3, 1*;58, Serial No. 7 65,136

Claims priori y, application Great Britain October 4, 1957 '11 Claims. Cl. 250-53 This invention relates to diiiractometer's such as are used for surveying "the X-ray, neutron or electron diffraction spectra of a crystal or the diffraction pattern of a non-periodic structure. The most usual application of the invention will be in the field of X-ray difiraction and the invention will be described with particular reference to this application. I

It is known that the diffraction pattern produced when monochromatic X-rays are diffracted by a single crystal may be represented by a three-dimensional array of points'defined in position by a lattice, the so-called reciprocal lattice, and weighted according to the diffracted intensity. Each spectrum or reflection is thus characterised by three parameters or indices which represent the components of the vector from the origin of the reciprocal lattice to the point representing that reflection. It can be shown that the geometrical conditions for a reflection to occur are satisfied whenever the crystaLand hence its reciprocal lattice, is rotated in the incident X-ray beam in such a way as to make the corresponding reciprocal lattice point lie on the surface of an imaginary sphere, the sphere of reflection."

Many difiractometerS? or spectrometers, that is instruments for measuring the intensities of the reflection by means of radiation detecting devices such as ionisation chambers or Geiger-Muller, proportional or scintillation counters have been described. 7 While these instruments differ in the particular geometrical arrangement adopted, they can be divided into twotypes: those in which all possible combinationsof counterpnd crystal settings are produced in turn and those in which the rotations of the crystal and counter for a given reflection are calculated and the angular settings are made on suitable scales graduated in degrees or other angular intervals. Since the calculations involve equations of transformation in which the reciprocal lattice co-ordinates are related to the instrumental angles by trigonometrical ratios, no systematic survey reflection by reflection is possible withouta separate calculationtor each reflection. Such a system is not readily adapted for any kind of automaticsurvey since three separate adjustments are needed in changing from one general reflection setting to another.

According to the present invention an analogue computer comprising a mechanical model of the reciprocal lattice or, in the simplest case a central plane of the reciprocal. lattice, is incorporated in a difliract'ometer. The

improved apparatus thus comprises a system of three translational slides (or two slides if only a central plane of the lattice is to be investigated) which provide linear translations in non-co-planar' directions and the system of slides is pivoted and constrained in such a manner that when a translation is effected on any one slide a rotation of the system takes place corresponding to the rotation of the reciprocal lattice which is required to satisfy the conditions for reflection, the detecting. device being at the sional arrangement,

2,928,945 Patented Mar. 15,1969

same time properly positioned to receive the reflected beam, while the specimen holder is coupled to the slide system in such'manner that the specimen undergoes ideirtical rotations. mechanical analogue of the reciprocal lattice and its m;- tation may be transferred to the specimen by parallel linkages, by gearing, or by an electro-mechanical servomechanism comprising selsyns or equivalentv devices. The detecting device may be attached to the slide sys em or both it and the specimen maybe arranged at adiatance from the slide system and the necessary movements transmitted in any convenient manner.

The apparatus of this invention permits the automatic surveying of the reciprocal lattice along any recipro al lattice line set parallel to any of the slides, rorexample along lines parallel to the edges of the reciprocal-lattice unit-cell. Since the distance to be covered in going fibril one reciprocal lattice'point to the next one"along any reciprocal-lattice line is constant, the same is true of the movement along the correspondingslide. In going along any one reciprocal-lattice line only one slide need be adjusted and this adjustment automatically ensures that the specimen and detector take up their appropriate positions. in order that the invention may be clearly understood it will now be described with reference to the 'accompartying drawings, in which: i

. a v 1 Figure 1 is a diagrammatic illustration showing how the principle of the invention is applied to a two-dimen- Figures 2 to 4 illustrate the application of theinvention to three-dimensional arrangements, and

Figure 5 is an isometric view of embodying the invention. 7

Referring now to Figure 1, C indicates the position of the specimen, XCO the direction of the-incident beam of X-rays, and O is the origin of the reciprocal lattice A slide A03 is pivoted at O and the saddleQ can be moved along it by some suitable device such as a micrometer.

the .slide BOA rotates about 0 and this rotation is transferred to the crystal atC either by linkages CD---0B and DB'CO as shown or by means of gear trains. Accord:- ing to the standard reciprocal lattice construction CP represents the direction of the reflection corresponding to the reciprocal lattice point P. The detecting device is therefore mounted on the arm CP. Then, if the distance PQ is kept constant moving saddle Q along OA will re suit in the scanning of all the reflections corresponding to reciprocal lattice points in the line RP which is parallel to OA and distance PQ from it.

The method can be extended to three dimensions in a number of different ways. If it is desired to restrict the movement of the detecting device to a single plane containing the incident beam, the two-dimensionalversion of Figure 1 may be modified to permit scanning of reci'p: rocal space in three dimensions subject to this limitationas shown diagrammatically in Figure 2. A third slide PR,- not coplanar with CA and QR, is provided and the whole slide system, the reciprocal lattice analogue, is -'allowed to rotate about OA constrained by the, arm CP whichis maintained in-the horizontal plane. The additional row tion is transferred to the specimen which is mounted for movement on a vertical circle or large arc, by a system of parallel linkages or gears.

An alternative version is illustrated in Figure 3., The line ;CP'on whichthe detecting device is motmtecl is new The system of slides is accordingly a one form; of apparatus allowed to move out of the horizontal plane. As in the arrangement of Figure 2, an additional slide GT is provided and rotation of the whole slide system is transferred to the specimen by the gearing indicated. This arrangement has the advantage that only a simple specimen mounting is required with only one axis of rotation always parallel to and the same distance from the rota- .tion' axis of the reciprocal lattice analogue. On the other hand it suffers from the disadvantage that a large region ofreciprocal space cannot be investigated since points in it cannot be brought into the sphere of reflection. This difliculty can be removed, however, by allowing the crystal and reciprocal-lattice-analogue axes of rotation to tilt. about an axis perpendicular to them and to the incident beam as illustrated in Figure 4.

. Further arrangements are possible but for general pur- -poses this 'equi-inclination method of Figure 4 in which the crystal axis, of rotation is equally inclined to the incident and to the diifracted beam is preferred since in this arrangement the crystal mounting is simple and its rotations are kept to. a minimum for complete coverage of the volume of reciprocal space near the origin. The volume of reciprocal space which can be surveyed depends on the traverses in the reciprocal lattice analogue and the orientations of the detecting device which are mechanically possible and on the wavelength of the radiation used. Following the principles discussed above, it is possible to construct an instrument for the linear surveying of all reciprocal space out to a radius corresponding to scatteringangles of 150 or more. An instrument with a lower limit of scattering angle is, however, easier to design and "is, moreover, for most purposes just as useful. Protein crystals,,for example, do not give reflections of copper Km radiation at higher scattering angles than 60 and the range of reflections available from other. crystals can be covered within such an upper limit by the use of a suitable radiation with short wavelength.

One form of apparatus embodying the invention and head 11 and is arranged in the path of an X-ray beam which is directed along a fixed axis 12 from a source, not shown. The goniometer head 11 is mounted on the lower end of a shaft 13 which is carried in bearing members 14' and 15. These members together with a lower member 16 are joined together by side members 17 to form a rigid assembly which is pivotally mounted between the cross-members 18 of a mainframe, which also includes the upright members 19, for rotation about an axis 20 which coincides with the axis of shaft 13 and intersects the axis 12 at the point 10. The upright members 19 of the frame 18, 19 are pivotally secured on uprights 21 which extend from the base 22 so that the frame can be rotated about an axis 23 which also passes through the point 10. The reciprocal lattice analogue comprising the system of slides 24, 25 and 26 is pivotally mounted on a horizontal bar 27 for rotation'about an axis 28. The ends of this bar are secured with the upright members 29 of a second frame and these members 29 are likewise pivotally mounted on uprights 36 which extend from the base 22 so that this frame can be rotated about an axis 31 which intersects the axes 12 and 28 in the point 48. The upright members of the two frames are also connected by parallel links 32 so that the frames are held parallel at any angular position relative to the base.

The lower slide 24 of the slide system is pivotally mounted on the bar 27 and is fast with a shaft 34 which is carried in bearings therein. The slide 24 carries a saddle 35 which is slidable thereon under control of a screw and nut mechanism operated by the wheel 36 and this saddle is secured with the second slide 25 which in turn carries a saddle 37 similarly adjustable along its length by wheel 38. As shown, the two slides 24 and 25 are arranged at right angles to one another but this is not essential and means may be provided for adjusting the angle between them. The saddle 37 carries a bearing for the lower end of a shaft 39 that 'forms a part of the third slide 26. -On this shaft 39 is slidably mounted an assembly comprising bearing members 40 to 43 which are rigidly secured between upright members 44. The assembly is adjusted on the shaft 39 by a screw and nut mechanism under control of the wheel 45, a threaded member fast with the wheel engaging a thread formed on a portion of the shaft 39. The assembly is also pivotally connected by means of parallel links 46 with the assembly 14-17. A counter or other radiation detecting device 47 is supported between the intermediate pair of links 46 and since the pivotal axis of these links on members 17 coincides with the axis 23, the counter will always be directed towards the specimen at point 10 irrespective of the movementof the apparatus.

. It will be seen that thepivotal connections of the links 46 with the members 44 and with the members 17 I ensure that-the axis of the slide 26 is always held parallel with the, axis of rotation 20 of the specimen and that the effective end of the counterarm corresponding to the point P in Figure l which is coincident with the point 48 in the central positionof the instrument shown in Figure 5 is constrained by these links to move over a spherical surface centred on the point 10. The point 48 is shown at the centre of the reciprocal lattice and the distance between the points 10 and 48 represents the radius of the sphere of reflection.

. As mentioned above, the whole slide system is pivotally mounted on the bar 27 and its rotation is transmitted by the shaft 34 through bevel gears 50, shaft 51, metal tapes 52' and 53, shaft 54 and bevel gears 55 to the shaft 13 on which the goniometer head 11 is mounted whereby any rotation of the slide system produces a corresponding rotation of the specimen.

To facilitate the setting up of the apparatus the shaft 13 is connected with its driving bevel gear 55 through storm of clutch whereby the goniometer head 11 and specimen maybe rotated without transmitting suchrotation through shaft 54 back to the slide system. To facilitatev adjustment a'disc 56 is provided on the shaft 13 which, when the clutch is disengaged, will be rotatable relative to disc 57 fast with bevel gear 55 and suitable scales may be provided, on the peripheries of the two discs. In operation of the apparatus, and assuming that the diffraction pattern of an orthorhombic crystal is to be surveyed', the crystal is set on the goniometer head 11 at the point 10 so that its 0 axis is parallel to the instrument axis 20 and so that its a axis is parallel to the reciproeal lattice-analogue-slide 24. The crystal b axis is then parallel to the slide 25, assuming that these two slides arearranged at right angles to one another.

The reflections I200 are located in turn by moving the effective centre of the counter, that is the point 48, along the slide24, the motion being controlled by manual or motorised rotation of the wheel 36. Since the distance between points 10'and 48 is fixed, movement of point 48 along slide 24 constrains the reciprocal-lattice-analogue to rotate about the axis 28 and the rotation ofshaft 34 is transferred'to the crystal by means of the drive system described. Reflections hlO are found by setting the elfective centre of the counter a distance b from the centre of the reciprocal lattice along the slide 25 (controlled by the wheel 38) and then 'again moving it along the slide 24. Similarly the rows of reflections h20, I and so on and hence the whole reciprocal lattice level hkO may be scanned systematically. In order to scan the reciprocal lattice level hkl, the counter is first centred on the slides 24 and 25 and is then moved a distance c along the slide 26 by means of the wheel 45. Again," becau e the distance between the crystal and reciprocal lattice axes {em nence the twoframes) tilt through an angle Theinstrument is balanced to facilitate this tilting. The

angle of 'tilt may be-fixed by rn'eans of a locking screw at 58 and the upper level hkl is then surveyed'in the same way as the zero level hkO. The remaining upper levels hkZ, hk3 and so on, and hence the whole diffraction pattern, are surveyed in the same way. To facilitate the adjustments, the wheels '36, 38 45 which control the movement of 'the's'lides may be provided with suitable scales or revolution counters (not shown) whereby the distance moved along each slide maybe readily observed.

It 'will be appreciated that in the instrument described 'the'survey of diffraction spectra from a crystal or of the diffraction pattern from a nonperiodic structure, is carried out by instrumentaladjustments which are linear translations along reciprocal lattice axes. This eliminates the necessity of computing settings of the instrument and makes possible completely, automatic data collections. Since for even a simple crystal with a small "unitcell hundreds of reflections must be measured, whileifor a complicated structure as that of a protein the number may run into tens .ofthousands, such automatic setting is of great importance. p p

.It .will be appreciated that many-variationsof the'illustrated embodiment of the invention are possible, for example the reciprocal lattice analogue might be mounted separately and used to generate the rotations which could then be transmitted by a remote control system to a diifractometer provided with the appropriate axes of rotation. 1

Moreover, the instrument described may be simplified if the full range of facilities provided is not required. For example, if an instrument is required for the investigation only of a central section of the diffraction pattern, the slide 26 and the facility for tilting the slide system and specimen about axes 31 and 23 may both be omitted. thus giving an instrument equivalent to that illustrated diagrammatically in Figure 1. Similarly an instrument corresponding to that illustrated diagrammatically in Figure 3 would be obtained if the slide 26 of the instrument shown in Figure 5 is retained but the facility for tilting the slide system and specimen about axes 31 and 23 is omitted. In both these simplified instruments the transmission of the rotation of the slide system to the specimen axis can be made more direct.

We claim:

l. A diffractometer comprising a holder for rotatably supporting a specimen in a beam of radiation, a radiation detector, means for positioning said detector to receive radiation reflected from said specimen, and for moving it over a spherical surface centred on said specimen, said means including a system of at least two slides adapted to provide linear translations in difierent directions, said system being mounted for rotation about an axis parallel tothe axis of rotation of said specimen and constrained by means of links such that a linear translation along any slide produces a corresponding rotation of said slide system, and means for coupling said specimen holder with said slide system such that rotation of said slide system produces a corresponding rotation of said specimen.

2. A diffractometer comprising a holder for supporting a specimen in a beam of radiation, means for rotating said holder, a radiation detector, means for supporting said detector to receive radiation reflected from said specimen and for moving it over a spherical surface centred on said specimen, said means comprising a slide system mounted for rotation about an axis parallel to the axis of rotation of said holder, said system including three slides providing linear translation each in a different and direction, link means constraining the movement at said '-'slide' system relative to ":the 'axis :of :rotation of said holder, and means coupling :said :slide system with said holder such that rotation of said-system produces-acornsponding rotation of said holder.

- 3. A diffractometer comprising :a :holder for supporting a specimen in a beam of radiation, :means :for .rotating .said holder, a radiation detector, means for constraining said detector for movement at :a constant distance from said specimen, means for supporting said detector comprising .a system of at least two slides each providing ia linear translation in a different direction, said slide system being mounted for rotation about an axis parallel '-to the axis of rotation of said holder, and means rotationally coupling said slide system and said :holder.

- 4. A difiractometer comprisingaholder for supporting a specimen in a beam of radiation, means for-"rotating :said holder, :a radiation detector, .means for supporting isaid detector to receive radiation reflected from said specimen, said means including-a system :compnsingtwo slides providing linear translations .in different directions in .a plane' normal to the axis-of rotation of said holder,

and means for constraining :said detector to nnove on :arcuate path .at a constant distancesfrom zsaid specimen, means for mounting said slide system for rotation about -:an axis parallel to :the :axis of rotation ofsaid holder, and means connecting :said slide system with :said holder 1 for producing rotational movement ofxsaid holder in .response to rotational movement of said slide system. 5.. A clifiractometer comprising :a holder for rotatably supporting a specimen in a beam of radiation,-a.1radiatiorn detector movably mounted to receive radiation reflected from said specimen, means for constraining said detector to move over a spherical surface centred on said specimen, supporting means for said detector comprising a.

system of three slides for producing linear translations in non-coplanar directions, means for mounting said slide system for rotation about an axis parallel with' the axis. of rotation of said holder and means for transferring rotation of said slide system for producing rotation of said holder. I

6. A diffractometer comprising a holder for supporting a specimen in a beam of radiation, means for rotating said holder about a first axis and for tilting said first axis about a second axis, said second axis intersecting said first axis and the axis of said beam, a radiation'de tector for receiving radiation reflected from said specimen, means constraining said detector to move over a spherical surface centred on said specimen, means for supporting said detector comprising a system of three slides providing linear translations in three non-coplanar directions, means for supporting said slide system for rotation about a third axis which extends parallel to said first axis and for tilting said slide system about a fourth axis which extends parallel to saidsecond axis, and means for transferring rotational movement of said slide system to produce a rotational movement of said specimen holder.

7. A diffractometer comprising a holder for supporting a specimen in a beam of radiation, a rotatably mounted shaft supporting said holder, a first bearing assembly supporting said shaft, a first frame pivotally mounted for tilting movement about an axis intersecting the axis of said shaft and the axis of said beam, said first bearing assembly being pivotally mounted in said first frame for rotation about the axis of said shaft, a second frame pivotally mounted for tilting movement about an axis parallel to the axis of tilting movement of said first frame, a slide system pivotally mounted in said second frame for rotation about an axis parallel to the axis of said shaft, said slide system comprising a first and a second slide for producing linear translations in different directions in a common plane and a third slide for producing a linear translation in a direction normal to said plane and parallel to the axis of said shaft, said third slide comprising arod, a secondbearing assembly pivotallymounted on :said ,-rod,-parallel links connecting said first and second bearing assemblies'and driving means for-transferring rotary movementwof said slide system to said shaft.

8. For a ditfractometerga mechanical analogueof the reciprocal lattice, said mechanical analogue comprising afsystem .of two interconnected slides each providing a linear translation in one of two coplanar directions, means [for mounting said systernfor rotation about an axis'nor- 'mal to the planes of said slides and means for constraining a point on one of said slides to move over an arcuate ,linki-means connecting one of said slides with a fixed .centre whereby to. constrain a point on said one slide to ,move over an .arcuate path at afixed distance from said centre. .i

10. For use witha diifractometer, a mechanical analogue of the reciprocal lattice, said mechanical analogue comprising a system of three interconnected slides providing linear translations in non-coplanar directions,

means for pivotally mounting on said system for rotation about an axis coinciding with the axis of translation of 8 a first slideot the system and normal to. a plane con taining, the axes of translation of the second-and. third slides of the system, and means for constraining the movement of said first slide such' that a point on it moves over a spherical surface about a fixed centre whereby a linear translation on any one of said three slides produces a rotation of theslide system which corresponds .tothat rotation of the reciprocal lattice which is required to satisfy the condition for reflection,

f ll. For use with a diffractometer, a mechanical an aiogu of, thereciprocal lattice, said mechanicalanalog'ue comprising 'asyster'n [of three interconnected slides providing linear translations 'in "non-coplanar directions, said system being mounted for rotation about an 'axis coinciding with the axis of translation of one slide'of the system and for tilting movement about an axis normal to the axis of rotation, and link means connecting said one slide With-a fixed centre whereby to constrain a point on said one slide to move over a spherical surface at a fixed distance trom said centre.

References Cited in the file of this patent UNITED STATES PATENTS 2,332,391 McLachlan Oct.- 19, 2,540,821 Harker Feb. 6, 1951 2,648,011 Good Aug. 4, 19-53 2,805,342 Lang Sept. 3, 1957 OTHER-REFERENCES Clark: Applied X-rays, 4th edition, 1955, pages 368 to 37 

